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2/3/2025 | 3:30 PM - 5:30 PM | Regency B
Imaging Algorithms for Metrology and Multiscale Characterization of Semiconductor Chips II
Presentations
Deep learning-enabled X-ray imaging for rapid assessment of thermal fatigue in SAC solder interconnects
Eshan Ganju | Purdue
Paper Number: COIMG-121
Presentation Time: 03:30 PM - 03:50 PM
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Eshan Ganju | Purdue
Paper Number: COIMG-121
Presentation Time: 03:30 PM - 03:50 PM
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Invited: Transient thermal characterization of nanoscale devices and 3D heterogeneous integrated circuits
Ali Shakouri | Purdue University
Paper Number: COIMG-122
Presentation Time: 03:50 PM - 04:10 PM
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Ali Shakouri | Purdue University
Paper Number: COIMG-122
Presentation Time: 03:50 PM - 04:10 PM
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Magnetic nanoscale x-ray metrology of unconventional topological spin textures
Peter Fischer | Lawrence Berkeley National Laboratory
Paper Number: COIMG-123
Presentation Time: 04:10 PM - 04:30 PM
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Peter Fischer | Lawrence Berkeley National Laboratory
Paper Number: COIMG-123
Presentation Time: 04:10 PM - 04:30 PM
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High-altitude earth observation with diffusion models for satellite LiDAR reconstruction
Andres Ramirez-Jaime | University of Delaware
Paper Number: COIMG-346
Presentation Time: 04:30 PM - 04:50 PM
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Andres Ramirez-Jaime | University of Delaware
Paper Number: COIMG-346
Presentation Time: 04:30 PM - 04:50 PM
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Imaging Algorithms for Metrology and Multiscale Characterization of Semiconductor Chips II
Description
2/3/2025 | 3:30 PM - 5:30 PM | Regency BPrimary Session Chair:
Singanallur Venkatakrishnan | Oak Ridge National Laboratory
Session Co-Chair:
Greg Buzzard | Purdue University
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